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GE Inspection Technologies Phasor XS Flaw Detector

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Product Description

GE Inspection Technologies Phasor XS Flaw Detector

Features :
  • Ultra-portable, battery-powered Phased Array at less than 3.8 kilograms (8.4 lbs)
  • Industry standard code-compliant ultrasonic flaw detector
  • Electronically controlled and selectable beam angles, focus and size
  • Simultaneous inspection with multiple beams from a single location
  • Simple operation allows for easy transition from conventional UT to Phased Array inspection
  • Field-proven rugged packaging to withstand heavy on-site use
  • Full-color, real-time sector image displays true depth
  • of indications, combined with selectable A-Scan
  • High visibility full-screen display and snap-shot
  • image storage of sector images, A-Scans, B-Scans,
  • measurement and on-screen set-up parameters
  • JPEG image reporting and data-set transfer via
  • SD memory card
  • On-board delay law calculator
  • Push-button control for ease-of-use and operation within a sealed bag for anti-contamination

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